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Proceedings Paper

Multichannel free-space intrachip optical interconnections: combining plastic micro-optical modules and VCSEL-based OE-FPGA
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Paper Abstract

We fabricated and replicated in semiconductor compatible plastics a multichannel free-space optical interconnection module designed to establish intra-chip interconnections on an Opto-Electronic Field Programmable Gate Array (OE-FPGA). The micro-optical component is an assembly of a refractive lenslet-array and a high-quality microprism. Both components were prototyped using deep lithography with protons and were monolithically integrated using a vacuum casting replication technique. The resulting 16-channel module shows optical transfer efficiencies of 50% and interchannel crosstalks as low as -22 dB. These characteristics are sufficient to establish multichannel intra-chip interconnects with OE- FPGAs. The OE-FPGA we used was designed within a European co- founded MEL-ARI consortium, working towards a manufacturable solution for optical interconnects between CMOS ICs. The optoelectronic chip combines fully functional FPGA digital logic with the drivers, receivers and flip-chipped optoelectronic components. It features 2 optical inputs and 2 optical outputs per FPGA cell, amounting to 256 photonic I/O links based on multimode 980-nm VCSELs and InGaAs detectors.

Paper Details

Date Published: 3 June 2002
PDF: 9 pages
Proc. SPIE 4652, Optoelectronic Interconnects, Integrated Circuits, and Packaging, (3 June 2002); doi: 10.1117/12.469577
Show Author Affiliations
Christof Debaes, Vrije Univ. Brussel (Belgium)
Michael Vervaeke, Vrije Univ. Brussel (Belgium)
Valerie Baukens, Vrije Univ. Brussel (Belgium)
Wim Meeus, Univ. Gent (Belgium)
Patrik Tuteleers, Vrije Univ. Brussel (Belgium)
Marnik Brunfaut, Univ. Gent (Belgium)
Jan M. Van Campenhout, Univ. Gent (Belgium)
Hugo Thienpont, Vrije Univ. Brussel (Belgium)

Published in SPIE Proceedings Vol. 4652:
Optoelectronic Interconnects, Integrated Circuits, and Packaging
Louay A. Eldada; John R. Rowlette; Randy A. Heyler; Randy A. Heyler; John R. Rowlette, Editor(s)

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