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Proceedings Paper

Optimized cladding materials for nonlinear-optic polymer-based devices
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Paper Abstract

We have investigated various conductive and nonconductive polymer materials suitable for use as cladding layers in nonlinear optic (NLO) polymer based opto-electronic devices. Our goal was to maximize the nonlinearity of the NLO core materials, while minimizing the total poling voltage and minimizing the absorption loss. Using a cladding material that is more conductive than the NLO core material, the majority of the applied poling voltage is dropped across the core, realizing a maximum EO coefficient with minimum applied poling voltage. We found, however, that there are tradeoffs between absorption loss, conductivity, refractive index, materials processability and materials compatibility when using off-the-shelf materials. Results are presented for a 3-layer device structure using a conductive polymer material for both the top and bottom cladding layers.

Paper Details

Date Published: 3 June 2002
PDF: 7 pages
Proc. SPIE 4652, Optoelectronic Interconnects, Integrated Circuits, and Packaging, (3 June 2002); doi: 10.1117/12.469557
Show Author Affiliations
Mary Leovich, Univ. of Dayton (United States)
Perry P. Yaney, Univ. of Dayton (United States)
Cheng H. Zhang, Univ. of Southern California (United States)
William H. Steier, Univ. of Southern California (United States)
Min-Cheol Oh, Univ. of Southern California (United States)
Harold R. Fetterman, Univ. of California/Los Angeles (United States)
Alex K.Y. Jen, Univ. of Washington (United States)
Larry Raymond Dalton, Univ. of Washington and Univ. of Southern California (United States)
James G. Grote, Air Force Research Lab. (United States)
Robert L. Nelson, Air Force Research Lab. (United States)
John S. Zetts, Air Force Research Lab. (United States)
Frank Kenneth Hopkins, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 4652:
Optoelectronic Interconnects, Integrated Circuits, and Packaging
Louay A. Eldada; Randy A. Heyler; John R. Rowlette; John R. Rowlette; Randy A. Heyler, Editor(s)

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