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Proceedings Paper

Simulation of transient dynamic behavior in laterally coupled VCSEL arrays
Author(s): Spilios Riyopoulos
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Paper Abstract

A novel, fast simulation tool for transient response is developed to study jitter and noise caused by lateral cavity interactions in VCSEL arrays. The cavity mode profiles, obtained from a paraxial eigenmode analysis, are used to derive fast 1-D rate equations that implement gain confinement, edge clipping, wide angle scattering and diffraction (self-interference) losses. These equations are augmented by lateral coupling terms describing the interactions among nearest neighbor cavities. Slow time scale coupling describes interactions of phase-shifted cavities via mutually induced electric polarization, cross-hole burning and cross-cavity gain due to optical fringe-field interactions. The tool is used to study cavity cross-talk, lateral bit pattern error effects, and the possibility of excitation of long range modulations over the array. Conclusions relating VCSEL packing density to BER, bit suppression by neighboring cavities, and array phase locking are given.

Paper Details

Date Published: 4 June 2002
PDF: 4 pages
Proc. SPIE 4649, Vertical-Cavity Surface-Emitting Lasers VI, (4 June 2002); doi: 10.1117/12.469232
Show Author Affiliations
Spilios Riyopoulos, Science Applications International Corp. (United States)

Published in SPIE Proceedings Vol. 4649:
Vertical-Cavity Surface-Emitting Lasers VI
Chun Lei; Sean P. Kilcoyne, Editor(s)

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