Share Email Print
cover

Proceedings Paper

Oxide VCSEL reliability qualification at Agilent Technologies
Author(s): Robert W. Herrick
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the past two years, Agilent Technologies has had a unique opportunity to study the reliability of VCSELs from most major manufacturers. We report on our methodology for qualifying prospective VCSEL suppliers, and briefly discuss our findings. The expected use environment for VCSELs is covered, along with VCSEL reliability limitations with existing technology. Differences between maverick and wearout failures are discussed, and examples of each are shown; VCSEL failure analysis is also briefly touched on. Finally, recent challenges in using oxide VCSELs in non-hermetic packaging, and 10 Gb/s operation, are briefly covered.

Paper Details

Date Published: 4 June 2002
PDF: 12 pages
Proc. SPIE 4649, Vertical-Cavity Surface-Emitting Lasers VI, (4 June 2002); doi: 10.1117/12.469227
Show Author Affiliations
Robert W. Herrick, Agilent Technologies (United States)


Published in SPIE Proceedings Vol. 4649:
Vertical-Cavity Surface-Emitting Lasers VI
Chun Lei; Sean P. Kilcoyne, Editor(s)

© SPIE. Terms of Use
Back to Top