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Proceedings Paper

VCSEL reliability research at Gore Photonics
Author(s): Ted D. Lowes
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Paper Abstract

Reliability of the oxide confined VCSEL used in the Gore nLIGHTENTM parallel optic interconnect is discussed. The Gore reliability program for oxide confined devices has been active for approximately five years. The excellent long term reliability results have been obtained through an approach centered upon fundamental reliability research. The details of the device lifetime measurements and projections are presented along with some specific examples of projects from our reliability research experiences.

Paper Details

Date Published: 4 June 2002
PDF: 9 pages
Proc. SPIE 4649, Vertical-Cavity Surface-Emitting Lasers VI, (4 June 2002); doi: 10.1117/12.469226
Show Author Affiliations
Ted D. Lowes, W.L. Gore and Associates (United States)

Published in SPIE Proceedings Vol. 4649:
Vertical-Cavity Surface-Emitting Lasers VI
Chun Lei; Sean P. Kilcoyne, Editor(s)

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