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Proceedings Paper

Torsional MEMS scanner design for high-resolution scanning display systems
Author(s): Hakan Urey
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Paper Abstract

In scanning display systems, high horizontal and vertical resolution, and high refresh rate requirements translate into large mirror-size scan-angle product and high scanner-frequency requirements. A comparison between published scan-angle mirror-size product values for MEMS scanners and a steel mechanical scanner is presented. Current performance levels of steel mechanical scanners are better; however, Silicon MEMS scanners have good material properties and should be able to reach and exceed the performance levels of conventional mechanical scanners. The resolution limitations of mechanical and MEMS scanners are established using dynamic mirror deformation, flexure stress, and other oscillation mode frequencies. Analytical formulas for torsional, vertical deflection mode, lateral deflection mode, and rocking mode natural frequencies are derived using mechanical beam deflection theory.

Paper Details

Date Published: 4 June 2002
PDF: 11 pages
Proc. SPIE 4773, Optical Scanning 2002, (4 June 2002); doi: 10.1117/12.469198
Show Author Affiliations
Hakan Urey, Microvision, Inc. (Turkey)

Published in SPIE Proceedings Vol. 4773:
Optical Scanning 2002
Stephen F. Sagan; Gerald F. Marshall; Leo Beiser, Editor(s)

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