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Proceedings Paper

Image processing method in measuring tiny surface with projecting grating profilometry
Author(s): Jianqiang Xu; Yunshan Wang; Dazhen Yun
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Paper Details

Date Published: 29 May 2002
PDF: 4 pages
Proc. SPIE 4537, Third International Conference on Experimental Mechanics, (29 May 2002); doi: 10.1117/12.468842
Show Author Affiliations
Jianqiang Xu, Dalian Univ. of Technology and Shandong Univ. (China)
Yunshan Wang, Shandong Univ. (China)
Dazhen Yun, Dalian Univ. of Technology (China)

Published in SPIE Proceedings Vol. 4537:
Third International Conference on Experimental Mechanics

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