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Proceedings Paper

Investigation on internal microstructure damage evolution in Bi-2223/Ag HTS tapes by synchrotron radiation
Author(s): Xiaofang Hu; Jinglei Yang; Zhenyu Jiang; Xiaoping Wu; Zhendao Wang; Yulian Tian; Wanxia Huang
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Paper Abstract

Experiments for damage evolution of internal structure in Bi- 2223/Ag sheathed tape under tensile loading at 77K were done at BSRF. With increasing of load, the start-up and growth of micro cracks in tape were observed. Depending on the experimental results, it showed that: superconducting capability kept on when the material was at linear elasticity, and would lose when the material came into being plastic flow.

Paper Details

Date Published: 29 May 2002
PDF: 4 pages
Proc. SPIE 4537, Third International Conference on Experimental Mechanics, (29 May 2002); doi: 10.1117/12.468831
Show Author Affiliations
Xiaofang Hu, Univ. of Science and Technology of China (China)
Jinglei Yang, Univ. of Science and Technology of China (China)
Zhenyu Jiang, Univ. of Science and Technology of China (China)
Xiaoping Wu, Univ. of Science and Technology of China (China)
Zhendao Wang, Cryogenic Lab./Chinese Academy of Science (China)
Yulian Tian, Institute of High Energy Physics (China)
Wanxia Huang, Institute of High Energy Physics (China)


Published in SPIE Proceedings Vol. 4537:
Third International Conference on Experimental Mechanics

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