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Proceedings Paper

Stress measurement with two-dimensional x-ray diffraction
Author(s): Bob B. He
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Paper Abstract

2D diffraction systems, when used for residual stress measurement, have many advantages over the conventional 1D diffraction systems in dealing with highly textured materials, large grain size, small sample area, and weak diffraction systems in dealing with highly textured materials, large grain size, small sample area, and weak diffraction. The stress measurement is based on the fundamental relationship between the stress tensor and the diffraction cone distortion. The benefit of the 2D method is that all the data points on diffraction rings are used to calculate stresses so as to get better measurement result with less data collection time. The present paper introduces the recent development in the theory and applications of stress measurement using 2D detectors.

Paper Details

Date Published: 29 May 2002
PDF: 4 pages
Proc. SPIE 4537, Third International Conference on Experimental Mechanics, (29 May 2002); doi: 10.1117/12.468800
Show Author Affiliations
Bob B. He, Bruker AXS (United States)


Published in SPIE Proceedings Vol. 4537:
Third International Conference on Experimental Mechanics

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