Share Email Print
cover

Proceedings Paper

Spatial characterization of strong fiber Bragg gratings
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Characterization of the complex relection spectrum and the spatial profile of fiber Bragg gratings using optical frequency domain reflectometry and the layer peeling algorithm is presented. The importance of correct scaling and polarization effects are discussed. The method gives accurate measurement of the spatial profile for grating with reflectivity < 98-99 %. Immunity to spurious reflections and high dynamic range in spectral measurements are achieved.

Paper Details

Date Published: 15 April 2003
PDF: 9 pages
Proc. SPIE 4943, Fiber-based Component Fabrication, Testing, and Connectorization, (15 April 2003); doi: 10.1117/12.468563
Show Author Affiliations
Ole Henrik Waagaard, Optoplan A/S (Norway)
Norwegian Univ. of Science and Technology (Norway)
Erlend Ronnekleiv, Optoplan A/S (Norway)
Jon Thomas Kringlebotn, Optoplan A/S (Norway)


Published in SPIE Proceedings Vol. 4943:
Fiber-based Component Fabrication, Testing, and Connectorization

© SPIE. Terms of Use
Back to Top