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Proceedings Paper

Using quantitative statistics for the construction of machine vision systems
Author(s): Neil A. Thacker
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Paper Abstract

This paper describes a design methodology for constructing machine vision systems. Central to this is the use of empirical design techniques and in particular quantitative statistics. The approach views both the construction and evaluation of systems as one and is based upon what could be regarded as a set of self-evident propositions; (1) Vision algorithms must deliver information allowing practical decisions regarding interpretation of an image. (2) Probability is the only self-consistent computational framework for data analysis, and so must form the basis of all algorithmic analysis processes. (3) The most effective and robust algorithms will be those that match most closely the statistical properties of the data. (4) A statistically based algorithm which takes correct account of all available data will yield an optimal result. Where the definition of optimal can be unambiguously defined by the statistical specification of the problem. Machine vision research has not emphasized the need for (or necessary methods of) algorithm characterization, which is unfortunate, as the subject cannot advance without a sound empirical base. In general this problem can be attributed to one of two factors; a poor understanding of the role of assumptions and statistics, and a lack of appreciation of what is to be done with the generated data. The methodology described here focuses on identifying the statistical characteristics of the data and matching these to the assumptions of the underlying techniques. The methodology has been developed from more than a decade of vision design and testing, which has culminated in the construction of the TINA open source image analysis/machine vision system [htt://www.tina-vision.net].

Paper Details

Date Published: 19 March 2003
PDF: 15 pages
Proc. SPIE 4877, Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision, (19 March 2003); doi: 10.1117/12.468491
Show Author Affiliations
Neil A. Thacker, Univ. of Manchester (United Kingdom)


Published in SPIE Proceedings Vol. 4877:
Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision
Andrew Shearer; Fionn D. Murtagh; James Mahon; Paul F. Whelan, Editor(s)

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