Share Email Print
cover

Proceedings Paper

Fiber-optic-based optical trapping and detection for lab-on-a-chip (LOC) applications
Author(s): Cynthia Jensen McMullin; Amy A. Au; Jerome Quinsaat; Edward R. Lyons; Henry P. Lee
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A three-fiber optical trapping/detection system has been molded in poly(dimethyl siloxane) (PDMS) using anisotropically etched Si V-grooves as the primary or master mold. The process of reverse molding in PDMS maintains the benefits of fiber optic self-alignment previously used in Si V-grooves. Two, pigtailed laser diodes emitting at 830 nm and 980 nm are connected to cleaved, single-mode (SM), counter-propagating fibers, used for trapping polystyrene beads. Orthogonal to the trapping fibers is a multi mode detection fiber coupled to a spectrometer. Chemically treated beads trapped by the 830 and 980 nm diode lasers were excited using a 660 nm diode laser. By utilizing the optical clarity of PDMS, the fourth excitation source fiber is mounted below the PDMS trap and used to excite the trapped beads. Changes in the relative intensity of the trapping light are used to indicate the capture and position of a bead in the trap. Additionally, detection of the excitation source and bead fluorescence is monitored.

Paper Details

Date Published: 28 May 2002
PDF: 7 pages
Proc. SPIE 4622, Optical Diagnostics of Living Cells V, (28 May 2002); doi: 10.1117/12.468343
Show Author Affiliations
Cynthia Jensen McMullin, Univ. of California/Irvine (United States)
Amy A. Au, Univ. of California/Irvine (United States)
Jerome Quinsaat, Univ. of California/Irvine (United States)
Edward R. Lyons, Univ. of California/Irvine (United States)
Henry P. Lee, Univ. of California/Irvine (United States)


Published in SPIE Proceedings Vol. 4622:
Optical Diagnostics of Living Cells V
Robert C. Leif; Daniel L. Farkas; Robert C. Leif, Editor(s)

© SPIE. Terms of Use
Back to Top