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Proceedings Paper

Vibration analysis of layered structures by optoelectronics methods
Author(s): Giuseppe Schirripa Spagnolo; Massimo Pappalardo; Antonio Iula; Riccardo Carotenuto; Raffaele Majo; Dario Ambrosini; Domenica Paoletti
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Paper Details

Date Published: 22 May 2002
PDF: 10 pages
Proc. SPIE 4827, Fifth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 May 2002); doi: 10.1117/12.468151
Show Author Affiliations
Giuseppe Schirripa Spagnolo, Univ. degli Studi di Roma Tre (Italy)
Massimo Pappalardo, Univ. degli Studi di Roma Tre (Italy)
Antonio Iula, Univ. degli Studi di Roma Tre (Italy)
Riccardo Carotenuto, Univ. degli Studi di Roma Tre (Italy)
Raffaele Majo, Univ. degli Studi di Roma Tre (Italy)
Dario Ambrosini, INFM/Univ. degli Studi dell'Aquila (Italy)
Domenica Paoletti, INFM/Univ. degli Studi dell'Aquila (Italy)


Published in SPIE Proceedings Vol. 4827:
Fifth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications

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