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Proceedings Paper

Influence of the baking process for chemically amplified resist on CD performance
Author(s): Shiho Sasaki; Takeshi Ohfuji; Masa-aki Kurihara; Hiroyuki Inomata; Curt A. Jackson; Yoshio Murata; Daisuke Totsukawa; Naoko Tsugama; Naoki Kitano; Naoya Hayashi; David H. Hwang
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Paper Abstract

CD uniformity and MTT (Mean to Target) control are very important in mask production for the 90nm node and beyond. Although it is well known that baking temperatures influence CD control in the CAR (chemically amplified resist) process for mask patterning, we found that 2 other process factors, which are related to acid diffusion and CA- reaction, greatly affect CD performance. We used a commercially available, negative CAR material and a 50kV exposure tool. We focused on the baking process for both PB (Pre Baking) and PEB (Post Exposure Bake). Film densification strength was evaluated from film thickness loss during PB. Plate temperature distribution was monitored with a thermocouple plate and IR camera. CA-reactions were also monitored with in-situ FTIR during PEB. CD uniformity was used to define the process influence. In conclusion, we found that airflow control and ramping temperature control in the baking process are very important factors to control CD in addition to conventional temperature control. These improvements contributed to a 30 % of reduction in CD variation.

Paper Details

Date Published: 27 December 2002
PDF: 8 pages
Proc. SPIE 4889, 22nd Annual BACUS Symposium on Photomask Technology, (27 December 2002); doi: 10.1117/12.468089
Show Author Affiliations
Shiho Sasaki, Dai Nippon Printing Co., Ltd. (Japan)
Takeshi Ohfuji, Intel K.K. (Japan)
Masa-aki Kurihara, Dai Nippon Printing Co., Ltd. (Japan)
Hiroyuki Inomata, Dai Nippon Printing Co., Ltd. (Japan)
Curt A. Jackson, Intel Corp. (United States)
Yoshio Murata, Intel. K.K. (Japan)
Daisuke Totsukawa, Dai Nippon Printing Co., Ltd. (Japan)
Naoko Tsugama, Intel K.K. (Japan)
Naoki Kitano, Intel K.K. (Japan)
Naoya Hayashi, Dai Nippon Printing Co., Ltd. (Japan)
David H. Hwang, Intel Corp. (United States)

Published in SPIE Proceedings Vol. 4889:
22nd Annual BACUS Symposium on Photomask Technology
Brian J. Grenon; Kurt R. Kimmel, Editor(s)

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