Share Email Print
cover

Proceedings Paper

Modeling phase-shifting masks
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An algebraic image perturbation model is introduced which used the point spread function of the lens and the mutual coherence of the illumination to give insight into the interactions of auxiliary patterns with features for the phase shifting mask technology. The model is based on adding electric field contributions and the cross term is shown to characterize the dominant interaction as a function of the number of auxiliary features, the relative coherence of the illumination, and the spreading of the image of the auxiliary pattern toward the feature. Data on the point/line spread functions and the mutual coherence are given and used to verify the accuracy of quantitative predictions of the change in peak intensity for lines and contacts when nonprinting phase shifting auxiliary patterns are added.

Paper Details

Date Published: 1 March 1991
PDF: 9 pages
Proc. SPIE 1496, 10th Annual Symp on Microlithography, (1 March 1991); doi: 10.1117/12.46757
Show Author Affiliations
Andrew R. Neureuther, Univ. of California/Berkeley (United States)


Published in SPIE Proceedings Vol. 1496:
10th Annual Symp on Microlithography
James N. Wiley, Editor(s)

© SPIE. Terms of Use
Back to Top