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Proceedings Paper

Application of microwave refractometer to flux profile relationships research
Author(s): Chengguo Liu; Jiying Huang; Changyin Jiang
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Paper Abstract

Microwave refractometer, a scientific instrument for the determination of atmospheric refractivity which is a function of air pressure, the temperature and the water vapor pressure, has much more exactness and faster response than the sensors of the pressure, the temperature and the humidity. A theory based on the parameter pseudo-refractivity has been developed, which can be used for the more exact determination of flux relationships with microwave refractometer. In this paper the advantages of microwave refractometer over the sensors are analyzed.

Paper Details

Date Published: 30 April 2003
PDF: 5 pages
Proc. SPIE 4894, Microwave Remote Sensing of the Atmosphere and Environment III, (30 April 2003); doi: 10.1117/12.467405
Show Author Affiliations
Chengguo Liu, Xidian Univ. (China)
China Research Institute of Radiowave Propagation (China)
Jiying Huang, Xidian Univ. (China)
Changyin Jiang, China Research Institute of Radiowave Propagation (China)


Published in SPIE Proceedings Vol. 4894:
Microwave Remote Sensing of the Atmosphere and Environment III
Christian D. Kummerow; JingShang Jiang; Seiho Uratuka, Editor(s)

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