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Proceedings Paper

High-resolution imaging with multilayer soft x-ray, EUV, and FUV telescopes of modest aperture and cost
Author(s): Arthur B. C. Walker; Joakim F. Lindblom; J. Gethyn Timothy; Richard B. Hoover; Troy W. Barbee; Phillip C. Baker; Forbes R. Powell
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Paper Abstract

The development of multilayer reflective coatings now permits soft X-ray, EUV and FUV radiation to be efficiently imaged by conventional normal incidence optical configurations. Telescopes with quite modest apertures can, in principle, achieve images with resolutions which would require apertures of 1.25 meters or more at visible wavelengths. The progress is reviewed which has been made in developing compact telescopes for ultra-high resolution imaging of the sun at soft X-ray, EUV and FUV wavelengths, including laboratory test results and astronomical images obtained with rocket-borne multilayer telescopes. The factors are discussed which limit the resolution which has been achieved so far, and the problems which must be addressed to attain, and surpass the 0.1 arc-second level. The application of these technologies to the development of solar telescopes for future space missions is also described.

Paper Details

Date Published: 1 September 1991
PDF: 14 pages
Proc. SPIE 1494, Space Astronomical Telescopes and Instruments, (1 September 1991); doi: 10.1117/12.46733
Show Author Affiliations
Arthur B. C. Walker, Stanford Univ. (United States)
Joakim F. Lindblom, Stanford Univ. (United States)
J. Gethyn Timothy, Stanford Univ. (United States)
Richard B. Hoover, NASA/Marshall Space Flight Ctr. (United States)
Troy W. Barbee, Lawrence Livermore National Lab. (United States)
Phillip C. Baker, Baker Consulting (United States)
Forbes R. Powell, Luxel Inc. (United States)

Published in SPIE Proceedings Vol. 1494:
Space Astronomical Telescopes and Instruments
Pierre Y. Bely; James B. Breckinridge, Editor(s)

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