Share Email Print
cover

Proceedings Paper

Measuring system for micro radius of curvature
Author(s): Tatsuya Narumi; Taizo Nakamura; Yasushi Ichihara; Yoshio Saruki; Jyota Miyakura
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have developed a system for measuring the radius of curvature of a micro spherical surface whose radius is several 10 μm to several 100 μm. This measuring system can measure a spherical surface by two methods, namely a Linnik micro-interferometer and a micro-colimator. In additon, this measuring system can measure a flat surface by a double-beam interferometer. Furthermore, the change of the optical system among those three measuring methods can be easily done by moving only the lens and shutter. Therefore, in this measuring system, each of the three measuring functions can be utilized without changing the setting of the workpiece. Thereby, the setting eror among the three measuring methods can be eliminated, so that the measuring accuracy and the measuring reliability have been improved.

Paper Details

Date Published: 18 October 2002
PDF: 8 pages
Proc. SPIE 4902, Optomechatronic Systems III, (18 October 2002); doi: 10.1117/12.467250
Show Author Affiliations
Tatsuya Narumi, Mitutoyo Corp. (Japan)
Taizo Nakamura, Mitutoyo Corp. (Japan)
Yasushi Ichihara, Mitutoyo Corp. (Japan)
Yoshio Saruki, Mitutoyo Corp. (Japan)
Jyota Miyakura, MSTI Inc. (Japan)


Published in SPIE Proceedings Vol. 4902:
Optomechatronic Systems III
Toru Yoshizawa, Editor(s)

© SPIE. Terms of Use
Back to Top