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Proceedings Paper

Noise properties of the inverse pi-scheme exponential radon transform
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Paper Abstract

Because the effects of physical factors such as photon attenuation and spatial resolution are distance-dependent in single-photon emission computed tomography (SPECT), it has been widely assumed that accurate image reconstruction requires knowledge of the data function over 2(π) . In SPECT with uniform attenuation, Noo and Wagner recently showed that an accurate image can be reconstructed from knowledge of the data function over a contiguous (π) -segment. More generally, we proposed (π) -scheme SPECT that entails data acquisition over disjoint angular intervals without conjugate views, totaling to (π) radians, thereby allowing flexibility in choosing projection views at which the emitted gamma-rays may undergo the least attenuation and blurring. In this work, we study the general properties of the (π) -scheme inverse exponential Radon Transform, and discuss how to take advantage of the (π) -scheme flexibility to improve noise properties of short-scan SPECT.

Paper Details

Date Published: 9 May 2002
PDF: 7 pages
Proc. SPIE 4684, Medical Imaging 2002: Image Processing, (9 May 2002); doi: 10.1117/12.467225
Show Author Affiliations
Emil Sidky, Univ. of Chicago (United States)
Chien-Min Kao, Univ. of Chicago (United States)
Patrick J. La Riviere, Univ. of Chicago (United States)
Xiaochuan Pan, Univ. of Chicago (United States)

Published in SPIE Proceedings Vol. 4684:
Medical Imaging 2002: Image Processing
Milan Sonka; J. Michael Fitzpatrick, Editor(s)

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