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Proceedings Paper

Reflectance stability analysis of Spectralon diffuse calibration panels
Author(s): Carol J. Bruegge; Albert E. Stiegman; Daniel R. Coulter; Robert R. Hale; David J. Diner; Arthur W. Springsteen
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Paper Abstract

The Multi-angle Imaging SpectroRadiometer (MISR) plans to use deployable diffuse reflectance panels to provide periodic radiometric calibrations of its nine cameras while in-flight. Near-Lambertian reflectance characteristics are desirable to facilitate flat-field camera intercomparisons. Also required is panel spatial and spectral uniformity, and stability with time. Spectralon, a commercially available polytetrafluoroethylene (PTFE) compound, has been baselined in the MISR design. To assess the suitability of this material, a series of degradation tests were planned and implemented. These included UV vacuum exposure and proton bombardment tests which simulated the exposure levels to be encountered during the mission life. Proton levels are now considered too low to be of concern, but UV vacuum tests demonstrate sensitivity to material contamination. Material investigations have concluded that hydrocarbons are present in the bulk of the material, and that plastic packaging materials can introduce additional surface-layer contamination. It is found however, that these unwanted elements can be eliminated through vacuum pumping at elevated temperatures. Exposure to a UV source, while in vacuum, is again planned for a set of targets which have been vacuum baked. This will assess the stability of the pure PTFE form.

Paper Details

Date Published: 1 August 1991
PDF: 11 pages
Proc. SPIE 1493, Calibration of Passive Remote Observing Optical and Microwave Instrumentation, (1 August 1991); doi: 10.1117/12.46691
Show Author Affiliations
Carol J. Bruegge, Jet Propulsion Lab. (United States)
Albert E. Stiegman, Jet Propulsion Lab. (United States)
Daniel R. Coulter, Jet Propulsion Lab. (United States)
Robert R. Hale, Jet Propulsion Lab. (United States)
David J. Diner, Jet Propulsion Lab. (United States)
Arthur W. Springsteen, Labsphere, Inc. (United States)


Published in SPIE Proceedings Vol. 1493:
Calibration of Passive Remote Observing Optical and Microwave Instrumentation
Bruce W. Guenther, Editor(s)

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