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Proceedings Paper

The short wave observation using the optical instrument for detecting microstructure of sea surface wave
Author(s): Yanfeng Wang; Sheng Guan; Yongyao Ding; Jun Fu; Weimin Huang
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Paper Abstract

The marine microwave remote sensing is based on the interaction between the EM wave and the small-scale wave with a wavelength comparable to that of the EM wave, so the most important in-situ work must be done to measure the structure of small-scale wave. The optical instrument for detecting microstructure of sea surface wave is used to obtain the pattern of fine scale wave, and a series of algorithm is developed to calculate the high frequency wave spectrum from the image data. The color-encoding method is used to measure the 2-D structure of water surface. The apparatus consists of 4 parts: the light source, a color-encoding plate, the Fresnel Lens, and 3CCD camera. The color-encoding plate is designed on the basis of the HSI Encoding method. The actual image size measured by the instrument is about 0.4 x 0.3m. The image’s sampling rate is 20Hz; the spatial resolution is 1mm with a dynamic slope range of ±45°. The system was successfully deployed in the water tank. The image processing is discussed to introduce how to get the wave number spectrum can be got from the original color slope image. The algorithm will provide a good opportunity for us to solve some problems in marine remote-sensing mechanism and oceanic dynamics.

Paper Details

Date Published: 8 May 2003
PDF: 11 pages
Proc. SPIE 4892, Ocean Remote Sensing and Applications, (8 May 2003); doi: 10.1117/12.466784
Show Author Affiliations
Yanfeng Wang, First Institute of Oceanography, SOA (China)
Institute of Oceanology (China)
Sheng Guan, Institute of Oceanology (China)
First Institute of Oceanography, SOA (China)
Yongyao Ding, First Institute of Oceanography, SOA (China)
Jun Fu, First Institute of Oceanography, SOA (China)
Weimin Huang, First Institute of Oceanography, SOA (China)


Published in SPIE Proceedings Vol. 4892:
Ocean Remote Sensing and Applications
Robert J. Frouin; Yeli Yuan; Hiroshi Kawamura, Editor(s)

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