Share Email Print
cover

Proceedings Paper

Effect of window function on noise power spectrum measurements in digital x-ray imaging
Author(s): Hang-yi Jiang; Wei R. Chen; Hong Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Noise power spectrum (NPS) is an important parameter of x- ray imaging systems. Accurate and precise measurement of NPS is crucial in the system characterization. One method to improve the accuracy of the NPS measurement is to implement window functions, which fall off gradually at the edge of the images, before the Fourier transform of the noise intensity. Such window functions can reduce frequency leakage caused by sharp intensity change at the edge of an image. Three window functions, Bartlett, Hann, and Welch, were studied for their effects on the NPS measurement using two different digital x-ray imaging systems. The noise power spectra masked by window functions were also compared with that of no window (or square window) masking. Our results showed that the window functions reduced the high-frequency contribution to the noise power spectrum, hence improving the accuracy of its measurement. The relative errors of NPS using different window functions relative to NPS using Welch window function showed that the square window had the most fluctuation.

Paper Details

Date Published: 13 May 2002
PDF: 7 pages
Proc. SPIE 4615, Biomedical Diagnostic, Guidance, and Surgical-Assist Systems IV, (13 May 2002); doi: 10.1117/12.466638
Show Author Affiliations
Hang-yi Jiang, Univ. of Oklahoma (United States)
Wei R. Chen, Univ. of Central Oklahoma and Univ. of Oklahoma (United States)
Hong Liu, Univ. of Oklahoma (United States)


Published in SPIE Proceedings Vol. 4615:
Biomedical Diagnostic, Guidance, and Surgical-Assist Systems IV
Tuan Vo-Dinh; David A. Benaron; Warren S. Grundfest, Editor(s)

© SPIE. Terms of Use
Back to Top