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Proceedings Paper

Parameterized surface reflectivity model for L-band radiometer
Author(s): Jiancheng Shi; Kun Shan Chen; Q. Li; Leung Tsang
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Paper Abstract

Soil moisture is an important parameter for hydrological and climatic investigations. Future satellite missions with L-band passive microwave radiometers will significantly increase the capability of monitoring Earth's soil moisture globally. Understanding the effects of surface roughness on microwave emission and developing quantitative bare surface soil moisture retrieval algorithms is one of the essential components in many applications of geophysical properties in the complex earth terrain by microwave remote sensing. In this study, we explore the use of the Integral Equation Model (IEM) for modeling microwave emission. This model was validated using a three-dimensional Monte Carlo model. The results indicate that the IEM model can be used to simulate the surface emission quite well for a wide range of surface roughness conditions with high confidence. Several important characteristics of the effects of surface roughness on radiometer emission signals at L-band 1.4 GHz that have not been adequately addressed in the current semi-empirical surface effective reflectivity models are demonstrated by using IEM simulated data. Using an IEM simulated database for a wide range of surface soil moisture and roughness properties, we developed a parameterized surface effective reflectivity model with three typically used correlation functions.

Paper Details

Date Published: 30 April 2003
PDF: 10 pages
Proc. SPIE 4894, Microwave Remote Sensing of the Atmosphere and Environment III, (30 April 2003); doi: 10.1117/12.466143
Show Author Affiliations
Jiancheng Shi, Institute for Remote Sensing Applications, CAS (China)
Univ. of California/Santa Barbara (United States)
Kun Shan Chen, National Central Univ. (Taiwan)
Q. Li, Univ. of Washington (United States)
Leung Tsang, Univ. of Washington (United States)

Published in SPIE Proceedings Vol. 4894:
Microwave Remote Sensing of the Atmosphere and Environment III
Christian D. Kummerow; JingShang Jiang; Seiho Uratuka, Editor(s)

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