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Proceedings Paper

Results from AMSR-E and Version 6 TMI microwave land rainfall estimation algorithms
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Paper Abstract

Revised versions of previous passive microwave land rainfall algorithms are developed for the Tropical Rainfall Measuring Mission (TRMM) Microwave Imager (TMI), the Special Sensor Microwave/Imager (SSM/I), and the new Advanced Microwave Sounding Radiometer-Earth Observing System (EOS) (AMSR-E). The relationships between rainfall rate and 85 GHz brightness temperature are re-calibrated with respect to previous algorithms using collocated TMI and TRMM Precipitation Radar (PR) data. Another new feature is a procedure to estimate the probability of convective rainfall, as convective/stratiform classification can reduce the abmiguity of possible rainfall rates for a given brightness temperature. These modifications essentially eliminate the global high bias found in studies of previous versions of the SSM/I and TMI algorithms. However, many regional and seasonal biases still exist, and these are identified. The applicability of the new features to the other microwave sensors is studied using SSM/I data. The AMSR-E algorithm is the same as the TMI, as the footprint resolutions and frequencies of these instruments are very similar. The TMI algorithm will be used in the land portion of the offical Version 6 TMI instantaneous rainfall rate product, to be released in 2003, while the AMSR algorithm will be used for future AMSR-E products.

Paper Details

Date Published: 30 April 2003
PDF: 12 pages
Proc. SPIE 4894, Microwave Remote Sensing of the Atmosphere and Environment III, (30 April 2003); doi: 10.1117/12.466110
Show Author Affiliations
Jeffrey R. McCollum, Univ. of Maryland/College Park (United States)
National Oceanic and Atmospheric Administration (United States)
Ralph R. Ferraro, Univ. of Maryland/College Park (United States)
National Oceanic and Atmospheric Administration (United States)


Published in SPIE Proceedings Vol. 4894:
Microwave Remote Sensing of the Atmosphere and Environment III
Christian D. Kummerow; JingShang Jiang; Seiho Uratuka, Editor(s)

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