Share Email Print
cover

Proceedings Paper

Low-temperature blackbodies and facility for calibration of them
Author(s): Svetlana P. Morozova; Pavel A. Morozov; Victor I. Sapritsky; Boris E. Lisiansky; N. L. Dovgilov; Yanxi Liang; Yanmei Li; Wenlong Yue
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The calibration of IR sensors, thermal imagers, instrumentation for remote earth sensing, signature recognition, and low background spacebome radiom-eters requires development of low- and near-ambient-temperature reference standard sources capable of operating in vacuum at low or medium background conditions. The paper contains the characteristics of blackbodies (BB), developed at the All-Russian Research Institute for Optical and Physical Measurements (VNIIOFI). A novel Medium Background Facility (MBF) intended for calibrating IR sources has been developed at VNIIOFI. The MBF used for the calibration under vacuum conditions (10-3 Pa) and medium background temperatures includes a Ga Fixed-Point Blackbody (29.76 °C), Variable Temperature Blackbody (-60 °C ~ +80 °C) and Filter Radiometer. A brief description of the operating principles and specifications of the MBF is presented. The results of a comparison of the Variable Temperature Blackbody and Ga Fixed Point Blackbody in the Medium Background Facility are given. The measurement uncertainties radiance temperature associated with spectral bandwidth are discussed.

Paper Details

Date Published: 20 September 2002
PDF: 7 pages
Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.465976
Show Author Affiliations
Svetlana P. Morozova, All-Russian Research Institute for Optical and Physical Measurements (Russia)
Pavel A. Morozov, All-Russian Research Institute for Optical and Physical Measurements (Russia)
Victor I. Sapritsky, All-Russian Research Institute for Optical and Physical Measurements (Russia)
Boris E. Lisiansky, All-Russian Research Institute for Optical and Physical Measurements (Russia)
N. L. Dovgilov, All-Russian Research Institute for Optical and Physical Measurements (Russia)
Yanxi Liang, Xi'an Institute of Applied Optics (China)
Yanmei Li, Xi'an Institute of Applied Optics (China)
Wenlong Yue, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 4927:
Optical Design and Testing
Zhicheng Weng; Jose M. Sasian; Yongtian Wang, Editor(s)

© SPIE. Terms of Use
Back to Top