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Proceedings Paper

Energy transfer dynamics in the A(0u+) state of Bi2
Author(s): Joseph Lee Cox; Michael W. Dolezal; Robert E. Franklin; Glen P. Perram
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Paper Abstract

Laser induced fluorescence, pulsed and CW, techniques have been used to study energy transfer within the A(0u+) state of Bi2. In particular, electronic quenching in the vibrational levels near predissociation, v' equals 18-25, have been examined for rare gas and nitrogen collision partners. The quenching from non-predissociated levels is independent of vibrational state and are rather rapid, 2.3 - 8.5 X 10-11 cm3molecule-s for v' equals 22. The quenching from the first significantly predissociated level, v' equals 23, is even faster with rate coefficients ranging from 7.4 - 15.7 X 10-11 cm3molecule-s. Heterogeneous predissociation is very rapid for 21 -1. Vibrational-to-translational energy transfer probabilities for the lowest vibrational levels, v' equals 0-4, range from 0.75 - 1.75 percent per collision, considerably lower than would be anticipated for these highly non-adiabatic collisions. Spectrally resolved emissions from collisionally populated rotational levels of Bi2(A,v' equals 1) were observed for helium, neon and argon collision partners after laser excitation of the high rotational levels J' equals 171, 201, and 231. Total rotational removal rates from the initially prepared state range from 2.8 - 8.9 X 10-10 cm3molecule-s. Collisional population of rotational states with (Delta) J

Paper Details

Date Published: 6 May 2002
PDF: 10 pages
Proc. SPIE 4631, Gas and Chemical Lasers and Intense Beam Applications III, (6 May 2002); doi: 10.1117/12.465784
Show Author Affiliations
Joseph Lee Cox, Air Force Institute of Technology (United States)
Michael W. Dolezal, Air Force Tactical Applications Ctr. (United States)
Robert E. Franklin, Aeronautical Systems Ctr. (United States)
Glen P. Perram, Air Force Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4631:
Gas and Chemical Lasers and Intense Beam Applications III
Steven J. Davis; Michael C. Heaven, Editor(s)

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