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Proceedings Paper

Two-dimensional measurement of birefringence disperion using spectroscopic polarized light
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Paper Abstract

This paper describes a method and system for two-dimensional measurement of birefringence dispersion with high-order and azimuthal direction. The system consists of a white light source, crossed polarizers and a detector carrying out the spectroscopic polarized light. A spectroscopic interferogram shows sinusoidaly in accordance with wave number change, and its period changes slightly because of dispersion of birefringence. The fast Fourier transform method is used to analyze the birefringence from the spectroscopic interferogram. One hundred and twenty-eight sets of images are used for birefringence analysis. Some results of 2-D birefringence dispersion distribution are shown for the demonstration of this method.

Paper Details

Date Published: 20 September 2002
PDF: 7 pages
Proc. SPIE 4919, Advanced Materials and Devices for Sensing and Imaging, (20 September 2002); doi: 10.1117/12.465724
Show Author Affiliations
Toshitaka Wakayama, Tokyo Univ. of Agriculture and Technology (Japan)
Hiroyuki Kowa, Uniopt Co., Ltd. (Japan)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 4919:
Advanced Materials and Devices for Sensing and Imaging
Jianquan Yao; Yukihiro Ishii, Editor(s)

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