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Proceedings Paper

Analysis of factors affecting the light collection efficiency in CT detector: CWO+PIN diode
Author(s): Sung Woo Kwak; Kwang Hyun Kim; Ho Kyung Kim; Gyuseong Cho; Seong Kyu Ahn; Sung Min Goh; Yoon Lee; Jung Byung Park
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Paper Abstract

The solid-state detector(SSD) for X-CT consists of photodiode coupled to CdWO4$(CWO. It is important to maximize the light collection in respect of a patient's dose, radiation effect and X-ray efficiency. The factors affecting the light collection efficiency are analyzed and optimized by using experimental data and appropriate simulation code. Quantum nomogram is used to investigate the signal propagation characteristics of optimally designed solid-state detector and to ensure at which stage quantum sink occurs. This paper shows that the part of SSD, the CWO of treatment with ground top/ground side yields higher quanta than that of ground top/polish side, which is different from the result of previous studies. We also shows that optimum thickness of SiN passivation and p-layer is 0.12mm and 0.1mm, respectively. From the quantum nomogram calculated for optimal design, it is predicted that the most serious signal degradation occurs at the photodiode.

Paper Details

Date Published: 3 May 2002
PDF: 8 pages
Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002); doi: 10.1117/12.465606
Show Author Affiliations
Sung Woo Kwak, Korea Advanced Institute of Science and Technology (South Korea)
Kwang Hyun Kim, Hyun Dae Nuclear Co., Ltd. (South Korea)
Ho Kyung Kim, Korea Advanced Institute of Science and Technology (South Korea)
Gyuseong Cho, Korea Advanced Institute of Science and Technology (South Korea)
Seong Kyu Ahn, Korea Advanced Institute of Science and Technology (South Korea)
Sung Min Goh, Chonbuk National Univ. (South Korea)
Yoon Lee, Korea Univ. (South Korea)
Jung Byung Park, Listem Corp. (South Korea)


Published in SPIE Proceedings Vol. 4682:
Medical Imaging 2002: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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