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Proceedings Paper

Spectroscopic analysis of charge transport characteristics in wide-bandgap semiconductor detectors
Author(s): Young Soo Kim; Gyuseong Cho; Ho Kyung Kim; Kwang Hyun Kim; Hee Joon Kim
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Paper Abstract

Wide-band-gap semiconductor detectors are recently in spotlight for various applications because of their good performances, such as the high energy resolution, the compactness in array geometry, and the room temperature operation. The performance of these detectors, for example, CdZnTe, is mainly limited by the charge transport properties. Especially, the dispersive nature of trapping and detrapping process affects on the detector performance resulting in random fluctuations in the current flowing. Based on the spectroscopic measurement, in this study, a simple analytical model is developed to investigate the charge transport characteristics for planar semiconductor detectors, especially for CdZnTe of m-i-m (metal-intrinsic-metal) diode structure. The model can take the input variables of material properties, as well as the operation parameters, such as the applied bias voltage, the pulse shaping time, the incident direction and the energy of gamma-rays. The measured gamma spectra from CdZnTe for Co57 showed excellent agreement with the simulation results from our model, and the parameters governing detector performance were analyzed. We expect that this model will be very useful to understand the charge transport mechanism in the wide-band-gap semiconductor detectors, and to optimally design the detector geometry for various applications.

Paper Details

Date Published: 3 May 2002
PDF: 11 pages
Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002); doi: 10.1117/12.465605
Show Author Affiliations
Young Soo Kim, Korea Advanced Institute of Science and Technology (South Korea)
Gyuseong Cho, Korea Advanced Institute of Science and Technology (South Korea)
Ho Kyung Kim, Korea Advanced Institute of Science and Technology (South Korea)
Kwang Hyun Kim, Korea Advanced Institute of Science and Technology (South Korea)
Hee Joon Kim, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 4682:
Medical Imaging 2002: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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