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Proceedings Paper

Noise properties of a Se-based flat-panel x-ray detector with CMOS readout integrated circuits
Author(s): Susumu Adachi; Shinya Hirasawa; Masayuki Takahashi; Hisao Okada; Yasukuni Yamane; Satoshi Yamada
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Paper Abstract

This paper describes the noise properties of a Se-based flat-panel X-ray detector (FPD) with 128-channel CMOS readout integrated circuits (ICs). The detector used in this study is a 23 cm X 23 cm direct detection FPD utilizing a thick a-Se film. The TFT array format is 1536 X 1536 pixels with a pixel pitch of 150 micrometers . The key component of this FPD is a newly developed CMOS readout IC, which integrates 128 readout channels. Each channel consists of a charge-sensitive amplifier (CSA), a low-pass filter (LPF), a correlated double sampling circuit (CDS), and an analog sample-hold circuit. To evaluate the noise properties, theoretical noise models, including a precise expression for the CDS, were constructed and compared with the measured results, which were obtained by analyzing the noise power spectra (NPS) of the dark images taken without X-ray exposure. In addition, the detective quantum efficiency (DQE) was measured at several fluoroscopic dose ranges to demonstrate the overall signal-to-noise performance. As a result, a total readout electronic noise of 2,100 e- rms was obtained, in which thermal noise and 1/f noise of the amplifier was dominant. The DQE(0) measured was about 0.5 at 1 (mu) R.

Paper Details

Date Published: 3 May 2002
PDF: 12 pages
Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002); doi: 10.1117/12.465603
Show Author Affiliations
Susumu Adachi, Shimadzu Corp. (Japan)
Shinya Hirasawa, Shimadzu Corp. (Japan)
Masayuki Takahashi, Sharp Corp. (Japan)
Hisao Okada, Sharp Corp. (Japan)
Yasukuni Yamane, Sharp Corp. (Japan)
Satoshi Yamada, Shimadzu Corp. (Japan)

Published in SPIE Proceedings Vol. 4682:
Medical Imaging 2002: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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