Share Email Print
cover

Proceedings Paper

Approaching the theoretical x-ray sensitivity with Hgl2 direct detection image sensors
Author(s): Robert A. Street; Steve E. Ready; Leonid Melekhov; Jackson Ho; Asaf Zuck; Barry N. Breen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The x-ray response of polycrystalline HgI2 for direct detection x-ray imagers, is studied using test arrays with 512 X 512 pixels of size 100 micron. We quantify the contributions to the x-ray sensitivity from electron and hole charge collection, x-ray absorption, effective fill factor and image lag, for x-ray energies from 25-100 kVp. The data analysis compares the measured sensitivity to the theoretical limit and identifies the contributions from various loss mechanisms. The sensitivity is explained by the ionization energy of approximately 5 eV, coupled with small corrections arising from incomplete x-ray absorption, incomplete charge collection, and image lag. Hence, imagers with HgI2 approach the theoretical maximum response for semiconductor detectors, with external array sensitivity demonstrated to within 50 percent of the limit.

Paper Details

Date Published: 3 May 2002
PDF: 9 pages
Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002); doi: 10.1117/12.465584
Show Author Affiliations
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)
Leonid Melekhov, Real Time Radiography Readout (Israel)
Jackson Ho, Xerox Palo Alto Research Ctr. (United States)
Asaf Zuck, Real Time Radiography Readout (Israel)
Barry N. Breen, Real Time Radiography Readout (Israel)


Published in SPIE Proceedings Vol. 4682:
Medical Imaging 2002: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

© SPIE. Terms of Use
Back to Top