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Proceedings Paper

Characterization and effect of system noise in a differential angle of arrival measurement device
Author(s): Arthur Howard Waldie; James J. Drexler; John A. Qualtrough; David B. Soules; Frank D. Eaton; William A. Peterson; John R. Hines
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Paper Abstract

Various sources of noise associated with angle of arrival measurements are discussed and their effect is evaluated and compared to experimental determinations of system noise. The predominant source of system noise is found to arise from the charge transfer process on the CCD detector itself. Image motion variance measurements are linear to within 3% over the range of image motion encountered in ro measurements with a correlation coefficient greater than 99% when compared to a known reference.

Paper Details

Date Published: 1 July 1991
PDF: 6 pages
Proc. SPIE 1487, Propagation Engineering: Fourth in a Series, (1 July 1991); doi: 10.1117/12.46555
Show Author Affiliations
Arthur Howard Waldie, Lockheed Engineering & Sciences Co. (United States)
James J. Drexler, Lockheed Engineering & Sciences Co. (United States)
John A. Qualtrough, Lockheed Engineering & Sciences Co. (United States)
David B. Soules, Lockheed Engineering & Sciences Co. (United States)
Frank D. Eaton, U.S. Army Atmospheric Sciences Lab. (United States)
William A. Peterson, U.S. Army Atmospheric Sciences Lab. (United States)
John R. Hines, U.S. Army Atmospheric Sciences Lab. (United States)


Published in SPIE Proceedings Vol. 1487:
Propagation Engineering: Fourth in a Series
Luc R. Bissonnette; Walter B. Miller, Editor(s)

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