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Proceedings Paper

Technological pathways for 21st century active matrix x-ray imager development
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Paper Abstract

In recent years, as a direct result of extensive research and development, a growing number of x-ray imagers based on the powerful concept of active matrix addressing have been introduced to clinical environments worldwide. These imagers consist of thin, large area, glass substrates onto which 2D, pixelated arrays are deposited. Each pixel comprises an amorphous silicon thin-film switch coupled to some form of pixel storage capacitor. The radiation is detected indirectly, by means of an overlying scintillators, or directly, by means of a photoconductor layer. While existing active matrix imagers offer many advantages, the present technology suffers form a variety of distinct limitations and disadvantages that pertain to imaging performance under conditions of low exposure per image frame, as well as to issues of mechanical robustness and cost. In this paper, the possibility that these restrictions could be removed through the adoption of novel, emerging technologies is discussed. The focus of the discussion is primarily on technologies under independent development for large-area electronics and other applications and for which a plausible chance of convergence with x-ray imaging technology exists.

Paper Details

Date Published: 3 May 2002
PDF: 8 pages
Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002); doi: 10.1117/12.465545
Show Author Affiliations
Larry E. Antonuk, Univ. of Michigan Medical Ctr. (United States)
Youcef El-Mohri, Univ. of Michigan Medical Ctr. (United States)
Kyung-Wook Jee, Univ. of Michigan Medical Ctr. (United States)
Qihua Zhao, Univ. of Michigan Medical Ctr. (United States)
Amit R. Sawant, Univ. of Michigan Medical Ctr. (United States)
Zhong Su, Univ. of Michigan Medical Ctr. (United States)
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)


Published in SPIE Proceedings Vol. 4682:
Medical Imaging 2002: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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