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Proceedings Paper

New thermistor material for thermistor bolometer: material preparation and characterization
Author(s): P. Umadevi; C. L. Nagendra; G. K. M. Thutupalli; K. Mahadevan; G. Yadgiri
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Paper Abstract

Structural, electrical, and infrared optical properties of screen-printed vanadium oxide thick films have been studied. It is seen that the original starting material, in the form of V2O3, undergoes a global transformation to its next higher oxide V2O5 during firing. This has been confirmed through differential thermal analysis (DTA) and x-ray diffraction analysis. The crystalline morphology of the transformed V2O5 seems to improve as a function of firing temperature in the range of 400- 600 degree(s)C. The associated screen-printed resistors have temperature coefficient of resistance in the range of -37,000 to -17,000 ppm per K over a temperature range of -65 to +155 degree(s)C and thermistor constant equal to 2000 K, which are independent of firing temperature. It is observed that both electrical resistivity and infrared emissivity decreases with increase of firing temperature, attaining values 1.12 X 102 ohm cm for electrical resistivity and 82% for infrared emissivity at a firing temperature of 550 degree(s)C.

Paper Details

Date Published: 1 August 1991
PDF: 11 pages
Proc. SPIE 1484, Growth and Characterization of Materials for Infrared Detectors and Nonlinear Optical Switches, (1 August 1991); doi: 10.1117/12.46515
Show Author Affiliations
P. Umadevi, ISRO Satellite Ctr. (India)
C. L. Nagendra, ISRO Satellite Ctr. (India)
G. K. M. Thutupalli, ISRO Satellite Ctr. (India)
K. Mahadevan, ISRO Satellite Ctr. (India)
G. Yadgiri, ISRO Satellite Ctr. (India)

Published in SPIE Proceedings Vol. 1484:
Growth and Characterization of Materials for Infrared Detectors and Nonlinear Optical Switches
Randolph E. Longshore; Jan W. Baars, Editor(s)

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