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Proceedings Paper

Edge effects in silicon photodiode arrays
Author(s): Steven B. Kenney; E. Dan Hirleman
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Paper Abstract

Photodiode arrays used in laser diffraction particle sizing instruments must be calibrated to account for detector-to-detector variations in sensitivity. We have calibrated an Insitec EPCS-P ring detector (planar-diffused, p on n silicon photodiode array) by scanning a focussed laser beam across the detector surface. A deconvolution of the known intensity distribution of the laser beam from the measured signal resulted in detector response as a function of position. Detector response was approximately constant over the region of the ideal active detector and it decreased exponentially in the region beyond the ideal detector boundary. A diffusion length constant of 50 microns gave the best fit to the measured data. Theoretical predictions of calibration factors based on measured detector response agreed reasonably well with Malvem and Insitec calibration factors obtained from the traditional uniform light illumination method. This indicates that edge effects in different ring detectors are similar.

Paper Details

Date Published: 1 July 1991
PDF: 12 pages
Proc. SPIE 1480, Sensors and Sensor Integration, (1 July 1991); doi: 10.1117/12.46494
Show Author Affiliations
Steven B. Kenney, Arizona State Univ. (United States)
E. Dan Hirleman, Arizona State Univ. (United States)

Published in SPIE Proceedings Vol. 1480:
Sensors and Sensor Integration
Peter D. Dean, Editor(s)

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