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Proceedings Paper

Possibility of determination of parameters of nanolayers by the modified Kretchman's scheme
Author(s): Valery A. Karpenko; Aleksei A. Romanenko
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Paper Abstract

It is shown that modification of Kretchman's scheme by deposition of dielectric thin film on the metal layer allows the sensitivity of the device to adsorbed layers to be increased. An analytical solution of the inverse problem of adsorbed layer parameters determination is obtained.

Paper Details

Date Published: 1 April 2002
PDF: 5 pages
Proc. SPIE 4750, ICONO 2001: Quantum and Atomic Optics, High-Precision Measurements in Optics, and Optical Information Processing, Transmission, and Storage, (1 April 2002); doi: 10.1117/12.464472
Show Author Affiliations
Valery A. Karpenko, Institute of Applied Optics (Belarus)
Aleksei A. Romanenko, Institute of Applied Optics (Belarus)


Published in SPIE Proceedings Vol. 4750:
ICONO 2001: Quantum and Atomic Optics, High-Precision Measurements in Optics, and Optical Information Processing, Transmission, and Storage

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