Share Email Print
cover

Proceedings Paper

Recent developments in the measurement of aspheric surfaces by contact stylus instrumentation
Author(s): Paul Scott
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Contact stylus instruments with sufficient range to resolution that could measure and analyze aspheric surfaces first appeared in the 1980s. These where limited to the measurement of a single profile over a rotationally symmetric aspheric surface. Although limited in use they proved to be very useful for the characterization of both optical and non-optical aspheric surfaces, correction of tool paths for aspheric generators etc. The work described here reviews recent developments in the measurement and characterization of aspheric surfaces by contact stylus instrumentation and includes measurement over an area rather than a single profile and measurement and the characterization of non-rotationally symmetric aspheric surfaces. Some of the challenges involved in the areal measurement of aspheric surfaces by contact stylus instrumentation will be described together with the techniques and considerations used to overcome these challenges. Specifically we will describe the mathematical models used to describe the aspheric surfaces and how these can be used to eliminate measurement set-up errors. How the finite size of the stylus can be corrected using techniques developed for image analysis. The automatic detection and removal of asperities using wavelet technology will be described. Finally the benefits and limitations of data fusion techniques to improve the range of the instrument will be reviewed.

Paper Details

Date Published: 20 September 2002
PDF: 9 pages
Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.464331
Show Author Affiliations
Paul Scott, Taylor Hobson Ltd. (United Kingdom)


Published in SPIE Proceedings Vol. 4927:
Optical Design and Testing
Zhicheng Weng; Jose M. Sasian; Yongtian Wang, Editor(s)

© SPIE. Terms of Use
Back to Top