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Proceedings Paper

Expert systems for optimization of laser technology processes
Author(s): Vladimir S. Maiorov; M. Yu. Sternin
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Paper Abstract

Many users of laser technological processes are trying to create data bases accumulating their experience in laser processing of materials. The data bases are useful tools to render help to technicians working with laser machines. But it is only the first step in utilization of intelligent computer programs. In this paper we present the results of the development of expert system (ES) to help technicians in the choice of best conditions for laser processing of materials. The ES has been created on the basis of practical knowledge of experts and experimental results collected to the data base. The set of parameters was developed for the description of laser technological processes. Each of the processes was characterized by the values of such parameters changing in some reasonable diapasons. Those parameters were divided into input and output groups. The input group of parameters included the main technical characteristics of the laser, the type of the material and the demands on the quality of laser processing products. The output group of parameters consisted of the set of laser processing conditions recommended by the expert system. Generally, the ES presents a computer model of the expert's decision making process. The steps of such a process are a new task analysis, search of closest past cases, evaluation of tasks similarity and so on. The expert system called MALS (Machine Learning Shell) is presented in this paper as an example of ES which could give consultations on the best choice of the laser cutting process.

Paper Details

Date Published: 30 April 2002
PDF: 6 pages
Proc. SPIE 4644, Seventh International Conference on Laser and Laser-Information Technologies, (30 April 2002); doi: 10.1117/12.464116
Show Author Affiliations
Vladimir S. Maiorov, Institute on Laser and Information Technologies (Russia)
M. Yu. Sternin, Institute for System Analysis (Russia)

Published in SPIE Proceedings Vol. 4644:
Seventh International Conference on Laser and Laser-Information Technologies

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