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Proceedings Paper

Mechanical characterization of polyvinylchloride pipes using electronic speckle pattern interferometry
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Paper Abstract

The use of electronic speckle pattern interferometry (ESPI) for non-destructive material characterization of thick and thin unplasticized polyvinylchloride (uPVC) pipes is presented. Pipes are tested by internal pressurization and ESPI gives a complete mapping of the resulting displacement field over the area imaged by the video camera. The results for the strain derived from ESPI data and from the standard mechanical method using strain gauges agree very well with each other. The interferometric method used is non-contact and gives high-confidence results for Young's modulus of uPVC pipes. The fringe counting method gives the total diplsacment over the field of view imaged by the CCD camera and is subject to a fringe error of 0.5. This simple approach is valid when the displacement behavior of the sample is known. When this is not the case then it is necessary to calculate the phase map of the displacement of digitally shifting the phase difference between the two beams in the interferometer. We have implemented this technique by modulating the laser diode drive current to alter the wavelength of the laser very slightly between frames. A linear phase map of the displacement is always obtained in the present case.

Paper Details

Date Published: 27 August 2003
PDF: 14 pages
Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); doi: 10.1117/12.463908
Show Author Affiliations
Emilia Mihaylova, Dublin Institute of Technology (Ireland)
Vincent Toal, Dublin Institute of Technology (Ireland)
Suzanne Martin, Dublin Institute of Technology (Ireland)
Brian W. Bowe, Dublin Institute of Technology (Ireland)

Published in SPIE Proceedings Vol. 4876:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications
Vincent Toal; Norman Douglas McMillan; Gerard M. O'Connor; Eon O'Mongain; Austin F. Duke; John F. Donegan; James A. McLaughlin; Brian D. MacCraith; Werner J. Blau, Editor(s)

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