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Proceedings Paper

The latest developments of high-gain Si microchannel plates
Author(s): Anton S. Tremsin; John V. Vallerga; Oswald H. W. Siegmund; Charles P. Beetz; Robert W. Boerstler
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Paper Abstract

We present our latest results in the development of Silicon micromachined microchannel plates, which open completely new possibilities in the detector technologies. For the first time Z-stacks of Si microchannel plates with pore bias of 5-8 degrees were tested in a high gain photon counting imaging detector without any post-amplification stage with conventional glass MCP's. The gain of Z-stacks of Si (40:1 L/D, 6 μm pores on 8 μm centers, 18-25 mm in diameter) MCP's was found to be as high as ~106 with peaked pulse height distribution. The full-field illumination images appeared to be quite uniform, with relatively small (~±10%) gain variation. Quantum efficiency of opaque diamond photocathode deposited on Si MCP was measured in reflection mode and compared with the performance of flat-substrate diamond photocathodes. We also present the results of our study of long-term gain stability of Si MCP's: variation of Si MCP gain as a function of extracted charge was investigated.

Paper Details

Date Published: 24 February 2003
PDF: 10 pages
Proc. SPIE 4854, Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation, (24 February 2003); doi: 10.1117/12.463766
Show Author Affiliations
Anton S. Tremsin, Space Sciences Lab., Univ. of California/Berkeley (United States)
John V. Vallerga, Space Sciences Lab., Univ. of California/Berkeley (United States)
Oswald H. W. Siegmund, Space Sciences Lab., Univ. of California/Berkeley (United States)
Charles P. Beetz, NanoSciences Corp. (United States)
Robert W. Boerstler, NanoSciences Corp. (United States)


Published in SPIE Proceedings Vol. 4854:
Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation
J. Chris Blades; Oswald H. W. Siegmund, Editor(s)

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