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Proceedings Paper

Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors
Author(s): M. M. Gourary; S. G. Rusakov; S. L. Ulyanov; M. M. Zharov; B. J. Mulvaney
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Paper Abstract

This paper presents an approach for noise characterization of read-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.

Paper Details

Date Published: 30 April 2002
PDF: 9 pages
Proc. SPIE 4761, Second Conference on Photonics for Transportation, (30 April 2002); doi: 10.1117/12.463477
Show Author Affiliations
M. M. Gourary, Institute of Projection Problems in Microelectronics (Russia)
S. G. Rusakov, Institute of Projection Problems in Microelectronics (Russia)
S. L. Ulyanov, Institute of Projection Problems in Microelectronics (Russia)
M. M. Zharov, Institute of Projection Problems in Microelectronics (Russia)
B. J. Mulvaney, Motorola, Inc. (United States)


Published in SPIE Proceedings Vol. 4761:
Second Conference on Photonics for Transportation

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