Share Email Print
cover

Proceedings Paper

Front-illuminated full-frame charge-coupled-device image sensor achieves 85% peak quantum efficiency
Author(s): Antonio S. Ciccarelli; William V. Davis; William Des Jardin; Hung Doan; Eric J. Meisenzahl; Laurel J. Pace; Gloria G. Putnam; Joseph E. Shepherd; Eric G. Stevens; Joseph R. Summa; Keith Wetzel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A high sensitivity front-illuminated charge-coupled device (CCD) technology has been developed by combining the transparent gate technology introduced by Kodak in 1999 with the microlens technology usually employed on interline CCDs. In this new architecture, the microlens is used to focus the incoming light onto the more transparent of the two electrodes. The new sensors offer significant increases in quantum efficiency while maintaining the performance advantages of front-illuminated full-frame CCDs including 3 pA/cm2 typical dark current at 25 degree(s)C, and 55 ke full well in a 6.8 micrometers pixel.

Paper Details

Date Published: 24 April 2002
PDF: 8 pages
Proc. SPIE 4669, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications III, (24 April 2002); doi: 10.1117/12.463447
Show Author Affiliations
Antonio S. Ciccarelli, Eastman Kodak Co. (United States)
William V. Davis, Eastman Kodak Co. (United States)
William Des Jardin, Eastman Kodak Co. (United States)
Hung Doan, Eastman Kodak Co. (United States)
Eric J. Meisenzahl, Eastman Kodak Co. (United States)
Laurel J. Pace, Eastman Kodak Co. (United States)
Gloria G. Putnam, Eastman Kodak Co. (United States)
Joseph E. Shepherd, Eastman Kodak Co. (United States)
Eric G. Stevens, Eastman Kodak Co. (United States)
Joseph R. Summa, Eastman Kodak Co. (United States)
Keith Wetzel, Eastman Kodak Co. (United States)


Published in SPIE Proceedings Vol. 4669:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications III
Nitin Sampat; John Canosa; Morley M. Blouke; John Canosa; Nitin Sampat, Editor(s)

© SPIE. Terms of Use
Back to Top