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Proceedings Paper

New colored optical security elements using Rolic's LPP/LCP technology: devices for first- to third-level inspection
Author(s): Franco Moia
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Paper Abstract

With linear photo-polymerization (LPP) ROLIC has invented a photo-patternable technology enabling to align not only conventional liquid crystals but also liquid crystals polymers (LCP). ROLIC's optical security device technology derives from its LPP/LCP technology. LPP/LCP security devices are created by structured photo-alignment of an LPP layer through phot-masks, thus generating a high resolution, photo-patterned aligning layer which carries the aligning information of the image to be created. The subsequent LCP layer transforms the aligning information into an optical phase image with low and/or very high information content, such as invisible photographic pictures. The building block capability of the LPP/LCP technology allows the manufacturing of cholesteric and non-cholesteric LPP/LCP devices which cover 1st and/or 2nd level applications. Apart from black/white security devices colored information zones can be integrated. Moreover, we have developed an LPP/LCP security device which covers all three- 1st, 2nd and 3rd- inspection levels in one and the same authentication device: besides a color shift by tilting the device (1st level) and the detection of normally hidden information by use of a simple sheet polarizer (2nd level) the new device contains encrypted hidden information which can be visualized only by superimposing an LPP/LCP inspection tool (key) for decryption (3rd level). This optical key is also based on the LPP/LCP technology and is itself a 3rd level security device.

Paper Details

Date Published: 19 April 2002
PDF: 9 pages
Proc. SPIE 4677, Optical Security and Counterfeit Deterrence Techniques IV, (19 April 2002); doi: 10.1117/12.462710
Show Author Affiliations
Franco Moia, Rolic Technologies Ltd. (Switzerland)


Published in SPIE Proceedings Vol. 4677:
Optical Security and Counterfeit Deterrence Techniques IV
Rudolf L. van Renesse, Editor(s)

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