Share Email Print
cover

Proceedings Paper

Microreflectance inspection of diode laser front facets
Author(s): Fabian Doerfel; Stefan Nerreter; Jens Wolfgang Tomm; Ruediger Grunwald; R. Kunkel; Johann Luft
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We report on specular reflectivity measurements at the position of the waveguide at front facets of commercial diode laser arrays. Since the waveguide thickness is such semiconductor structures amounts about 1 micrometers an even better spatial resolution of the probe light spot is required. For this purpose, a micro-reflectance setup was designed and implemented. For re-locating the optically active region, e.g. after stepped-up operation time, we employ the photosensitivity of the active region by using the photocurrent induced by the probe beam for auto- alignment of the setup. We show for coated InGaAlAs/GaAs- single chip devices that during long-term operation the diode laser front facet reflectivity at the position of an emitter is almost constant with a slight tendency (about 0.002 at 633 nm) to increase. The results are explained in the framework of defect-induced refractive index changes within the semiconductor material close to the interface between waveguide and facet coating.

Paper Details

Date Published: 16 April 2002
PDF: 7 pages
Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, (16 April 2002); doi: 10.1117/12.462659
Show Author Affiliations
Fabian Doerfel, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Stefan Nerreter, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Jens Wolfgang Tomm, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Ruediger Grunwald, Ferdinand-Braun Institute fuer Hochstfrequenztecnik (Germany)
R. Kunkel, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Johann Luft, OSRAM Opto Semiconductors GmbH & Co. (Germany)


Published in SPIE Proceedings Vol. 4648:
Test and Measurement Applications of Optoelectronic Devices
Niloy K. Dutta; Robert W. Herrick; Aland K. Chin; Niloy K. Dutta; Robert W. Herrick; Kurt J. Linden; Daniel J. McGraw, Editor(s)

© SPIE. Terms of Use
Back to Top