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Proceedings Paper

Diode laser testing by taking advantage of its photoelectric properties
Author(s): Jens Wolfgang Tomm; A. Gerhardt; Dirk Lorenzen; P. Henning; H. Roehle
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Paper Abstract

We report on the potential of the photocurrent technique as analytical tool for diode laser testing. The physics involved into the generation of photocurrents as well as experimental requirements for detecting them are highlighted. Based on a number of practical examples, we demonstrate how knowledge about the photoelectrical properties of diode lasers can help to learn about stress and defects within packaged devices or how non-perfect device fabrication may be discovered. These results are discussed in conjunction with device reliability issues.

Paper Details

Date Published: 16 April 2002
PDF: 13 pages
Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, (16 April 2002); doi: 10.1117/12.462652
Show Author Affiliations
Jens Wolfgang Tomm, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
A. Gerhardt, Max-Born Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Dirk Lorenzen, JENOPTIK Laserdiode GmbH (Germany)
P. Henning, JENOPTIK Laserdiode GmbH (Germany)
H. Roehle, Heinrich-Hertz Institut fur Nachrichtentechnik (Germany)

Published in SPIE Proceedings Vol. 4648:
Test and Measurement Applications of Optoelectronic Devices
Niloy K. Dutta; Aland K. Chin; Robert W. Herrick; Niloy K. Dutta; Robert W. Herrick; Kurt J. Linden; Daniel J. McGraw, Editor(s)

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