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Proceedings Paper

Slit function measurement optical stimulus
Author(s): Kees Smorenburg; Marcel R. Dobber; Erik Schenkeveld; Ramon Vink; Huib Visser
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Paper Abstract

For the calibration of OMI a slit function measurement stimulus has been developed. The slit function is the monochromatic image of the entrance slit of the spectrometer on the detector. Accurate knowledge of this slit function for all wavelengths and field angles is very important both for the spectral calibration and for the DOAS retrieval algorithm. Determination of this function with a spectral line source is inaccurate, because of the detector resolution and incomplete, because of the limited number of discrete spectral lines, that are available. For accurate and complete measurement of the slit function an echelle monochromator has been developed, that offers a number of spectral lines, that can be scanned with a small wavelength step over the entire spectral range of OMI. The spectral bandwidth of these lines is about 0.1 x the spectral resolution of OMI and the wavelength step during scanning is even smaller. The wavelength scanning is performed by accurate rotation of the echelle. In this paper the scientific background of the slit function measurement, the stimulus and first OMI slit function calibration measurements are described.

Paper Details

Date Published: 8 April 2003
PDF: 10 pages
Proc. SPIE 4881, Sensors, Systems, and Next-Generation Satellites VI, (8 April 2003); doi: 10.1117/12.462482
Show Author Affiliations
Kees Smorenburg, TNO-TPD (Netherlands)
Marcel R. Dobber, Royal Netherlands Meteorological Institute (Netherlands)
Erik Schenkeveld, Dutch Space B.V. (Netherlands)
Ramon Vink, TNO-TPD (Netherlands)
Huib Visser, TNO-TPD (Netherlands)

Published in SPIE Proceedings Vol. 4881:
Sensors, Systems, and Next-Generation Satellites VI
Hiroyuki Fujisada; Joan B. Lurie; Michelle L. Aten; Konradin Weber; Joan B. Lurie; Michelle L. Aten; Konradin Weber, Editor(s)

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