Share Email Print
cover

Proceedings Paper

Effect of discreteness of laser action and condensed medium response on the nonlinear and photophysical phenomena
Author(s): Mikhail N. Libenson; Vitali E. Gruzdev
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

There are considered manifestations of influence of discreteness of the matter and laser action on laser-induced nonlinear optical and photophysical processes in condensed media. In particular, influence of material discreteness results in small terms appearing in addition to Ewald-Oseen extinction theorem. They depend strongly on type and characteristic size of crystal lattice and on character of electromagnetic interaction between neighboring secondary radiators discretely placed in points of the crystal lattice. Those terms determine near field of material response with fast decay as well as some effects in propagation of super-short laser pulses. It is stated that considered type of discreteness of material response is important for analysis of nonlinear-optical processes in near-field optical systems, low-dimensional quantum structures and for consideration of interaction of super- short laser pulses with materials when optical response is formed by few atomic layers. There are also explained significant differences in results of action of continuos and pulsed-periodic (discrete) scanning laser radiation on surface. They come through general impossibility of asymptotical coming to steady distribution in case of discrete action if laser-induced optical and photophysical processes are coupled through strong feedbacks.

Paper Details

Date Published: 9 April 2002
PDF: 7 pages
Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); doi: 10.1117/12.461707
Show Author Affiliations
Mikhail N. Libenson, S.I. Vavilov State Optical Institute (Russia)
Vitali E. Gruzdev, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 4679:
Laser-Induced Damage in Optical Materials: 2001
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top