Share Email Print

Proceedings Paper

Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nm
Author(s): Christian Goerling; Uwe Leinhos; Klaus R. Mann
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Absorptance losses in MgF2, CaF2, and BaF2 during 193-nm (DUV) and 157-nm (VUV) irradiation were investigated by employing a high-resolution laser calorimetric technique which allows the determination of both single and two-photon absorption coefficients. A strong wavelength dependence of the DUV and VUV absorption characteristics was observed: while effective two-photon absorption takes place at 193 nm, only minor effects were found at 157 nm. Due to the strong nonlinear behaviour the absorptance at 193 nm exceeds that at 157 nm above a critical energy density. A first explanation for this absorption behaviour is given implying the energetic band structure of CaF2. Furthermore, different single and two-photon absorption coefficients were determined for different CaF2 samples, indicating a two-photon two-step absorption mechanism. In addition, laser-induced aging was found in MgF2 at 193 nm, but not at all at 157 nm. The laser-induced fluorescence (LIF) spectra of alkaline- earth fluorides revealed a different emission behaviour for 193-nm and 157-nm excitation. Time-resolved as well as energy dependent measurements of intensities gave evidence for recombination fluorescence arising from self-trapped excitons as well as from specific impurities.

Paper Details

Date Published: 9 April 2002
PDF: 8 pages
Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); doi: 10.1117/12.461690
Show Author Affiliations
Christian Goerling, Laser-Lab. Goettingen e.V. (Germany)
Uwe Leinhos, Laser-Lab. Goettingen e.V. (Germany)
Klaus R. Mann, Laser-Lab. Goettingen e.V. (Germany)

Published in SPIE Proceedings Vol. 4679:
Laser-Induced Damage in Optical Materials: 2001
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top