Share Email Print
cover

Proceedings Paper

Erbium spectroscopy in photosensitive tin-doped silica glass
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

There is considerable interest in Er-doped silica-based materials with photosensitive properties for lasing and photorefractive applications. Tin doping has been recently found to induce strong and stable photosensitivity in silica glass. In this work, Er co-doped Sn-doped silica samples are obtained by sol-gel method by hydrolysis and condensation of TEOS and tin dibutyl diacetate, Er(NO3)3, or Er(CH3COO)3 as dopant precursors. Samples with Er content ranging between 0.1 and 1 mol% are investigated. Sn doping (0.4 mol%) is employed to induce photorefractivity properties in the glassy host. Time resolved photoluminescence, optical absorption and refractive index measurements are carried out and analyzed as a function of the Er content. The specific effects of Er content and Sn doping on the rare earth emission efficiency and photosensitivity of the glass are discussed. In particular it is shown that the Er emission shows the typical features of Er doped sol gel silica and the strong photosensitivity induced by tin doping is not affected by rare earth ions.

Paper Details

Date Published: 5 April 2002
PDF: 8 pages
Proc. SPIE 4645, Rare-Earth-Doped Materials and Devices VI, (5 April 2002); doi: 10.1117/12.461661
Show Author Affiliations
Norberto Chiodini, INFM/Univ. degli Studi di Milano-Bicocca (Italy)
Alberto Paleari, INFM/Univ. degli Studi di Milano-Bicocca (Italy)
Giorgio Spinolo, INFM/Univ. degli Studi di Milano-Bicocca (Italy)
Gilberto Brambilla, Univ. of Southampton (United Kingdom)
Alessandro Chiasera, INFM/Univ. degli Studi di Trento (Italy)
Maurizio Ferrari, INFM/Univ. degli Studi di Trento (Italy)


Published in SPIE Proceedings Vol. 4645:
Rare-Earth-Doped Materials and Devices VI
Shibin Jiang; Robert W. Keys, Editor(s)

© SPIE. Terms of Use
Back to Top