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Proceedings Paper

Passive and active characterization of hybrid glass substrates for telecommunication applications
Author(s): Joseph S. Hayden; Robert D. Simpson; Samuel D. Conzone; Robert K. Hickernell; Berton Callicoatt; Alexana Roshko; Norman A. Sanford
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Paper Abstract

Phosphate glasses have become increasingly popular for planar waveguide devices owing in part to the development of a number of different commercial compositions with a wide range of optical, physical, chemical and laser properties. In addition, the recent development of low temperature bonding technology has made possible the fabrication of structures involving multiple glasses prepared as a single hybrid substrate. Combined, these new materials and technologies make possible the creation of devices with increasing integration and complexity. Here, we present passive characterization data collected on glass joints prepared with the low temperature bonding technology and active performance data of a hybrid DBR laser where the surface relief grating has been fabricated in the passive glass region of a hybrid substrate.

Paper Details

Date Published: 5 April 2002
PDF: 8 pages
Proc. SPIE 4645, Rare-Earth-Doped Materials and Devices VI, (5 April 2002); doi: 10.1117/12.461643
Show Author Affiliations
Joseph S. Hayden, Schott Glass Technologies, Inc. (United States)
Robert D. Simpson, Schott Glass Technologies, Inc. (United States)
Samuel D. Conzone, Schott Glass Technologies, Inc. (United States)
Robert K. Hickernell, National Institute of Standards and Technology (United States)
Berton Callicoatt, National Institute of Standards and Technology (United States)
Alexana Roshko, National Institute of Standards and Technology (United States)
Norman A. Sanford, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 4645:
Rare-Earth-Doped Materials and Devices VI
Shibin Jiang; Robert W. Keys, Editor(s)

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